The cost of testing complex system-on-chip designs will soon surpass the cost of manufacturing them. Clearly this is an unstable situation. It is simply too hard to keep up with Moore's Law. While the ...
Return to original Test Digest book review. VLSI Test Principles and Architectures: Design for Testability, Laung-Terng Wang, Chen-Wen Wu, and Xiaoquing Wen (editors), Elsevier Science ...
In the dynamic world of VLSI (Very Large-Scale Integration), the demand for innovative products is higher than ever. The journey from a concept to a fully functional product involves many challenges ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results